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MSE 417

Scanning Electron Microscopy

Catalog2026-2027
Credits3 units
LevelUpper Division
Average gradeA-
Standard

Overview

Description

Advanced topics in scanning electron microscopy, including secondary electron imaging, backscattered electron imaging, energy dispersive spectroscopy and electron backscattered diffraction. Hands-on experience of operation on scanning electron microscope (SEM) in the lab using the Thermo Scientific Scios 2 FIB/SEM.

Requirements

Prerequisites

MSE 250
Original catalog text

Prerequisites

Prerequisite(s): MSE 250.

Units

Lecture2
Laboratory Studio1

Catalog Details

Offering

Offered: Every Fall - Odd Years

Terms

fall

Attributes

Standard

Learning Outcomes

  • identify, formulate, and solve complex engineering problems by applying principles of engineering, science, and mathematics.
  • function effectively on a team whose members together provide leadership, create a collaborative and inclusive environment, establish goals, plan tasks, and meet objectives.
  • develop and conduct appropriate experimentation, analyze and interpret data, and use engineering judgment to draw conclusions.